Using Accelerated Life Tests Results to Predict Product Field Reliability
|Date:||Friday, September 26|
|Time:||12:10 pm -- 1:00 pm|
|Speaker:||William Q. Meeker|
The talk will introduce some of the basic ideas of life data analysis, but use some novel more advanced modeling ideas to solve the particular problem that we faced. I have talked about this problem in the department before, but the work is now complete and should be completely new to all of the students.